Analysis of Conformance Test Reliability Based on Formal Specification

Lü Xin-yan; Zhao Bao-hua; Qu Yu-gui

doi:10.3724/SP.J.1146.2005.01105

Volume 29 Issue 4

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Article Navigation > Journal of Electronics & Information Technology > 2007 > 29(4): 781-784

Lü Xin-yan, Zhao Bao-hua, Qu Yu-gui. Analysis of Conformance Test Reliability Based on Formal Specification[J]. Journal of Electronics & Information Technology, 2007, 29(4): 781-784. doi: 10.3724/SP.J.1146.2005.01105

Citation:

Lü Xin-yan, Zhao Bao-hua, Qu Yu-gui. Analysis of Conformance Test Reliability Based on Formal Specification[J]. Journal of Electronics & Information Technology, 2007, 29(4): 781-784. doi: 10.3724/SP.J.1146.2005.01105

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Analysis of Conformance Test Reliability Based on Formal Specification

doi: 10.3724/SP.J.1146.2005.01105 cstr: 32379.14.SP.J.1146.2005.01105

Received Date: 2005-09-02
Rev Recd Date: 2006-04-03
Publish Date: 2007-04-19

Abstract

Abstract

Many description languages can be used by the formal specification, but there is a uniform method which can perform the conformance test under the formal specification. Adopting a statistical method, this paper analyses the conformance test reliability based on the formal specification, then it will give the confidence interval for the reliability and especially point out the conditions which can affect the reliability under zero-error.

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References

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